yellow light emission from ta2o5:er, eu, ce thin films deposited using a simple co-sputtering method
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ID: 134070
2015
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Abstract
Erbium, europium, and cerium co-doped tantalum oxide (Ta2O5:Er, Eu, Ce) thin films were prepared using a simple co-sputtering method, and yellow light emission was observed by the naked eye from a sample annealed at 900 °C for 20 min. The hexagonal Ta2O5 phase is very important, but the hexagonal CeTa7O19 phase should be avoided to obtain strong yellow light emission from Ta2O5:Er, Eu, Ce films. The co-sputtered films can be used as high-refractive-index and yellow-light-emitting materials of autocloned photonic crystals that can be applied to novel light-emission devices, and they will also be used as anti-reflection and down-conversion layers toward high-efficiency silicon solar cells.
| Reference Key |
miura2015resultsyellow
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| Authors | ;K. Miura;T. Osawa;T. Suzuki;Y. Yokota;O. Hanaizumi |
| Journal | international journal of aerospace engineering |
| Year | 2015 |
| DOI |
10.1016/j.rinp.2014.11.003
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| URL | |
| Keywords | Keywords not found |
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