IDeF-X HDBD:low-noise ASIC for Spectro-imaging with semiconductor detectors

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ID: 119624
2018
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Reference Key
passeron20182018idef-x Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors D. Baudin,K. Altenmuller,P-A. Bausson,X. Coppolani,O. Gevin,O. Limousin,D. Maier,A. Meuris,C. Passeron;D. Baudin;K. Altenmuller;P-A. Bausson;X. Coppolani;O. Gevin;O. Limousin;D. Maier;A. Meuris;C. Passeron;
Journal 2018 ieee nuclear science symposium and medical imaging conference proceedings (nss/mic)
Year 2018
DOI
10.1109/nssmic.2018.8824740
URL
https://sciprofiles.com/publication/view/5a83cbe79f520c40a445e32edf0358d9
Keywords
noise semiconductor detectors circuit optimized asic charge imaging spectroscopy idef hdbd

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