Surface Oxidation of Bi2(Te,Se)3 Topological Insulators Depends on Cleavage Accuracy

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ID: 118038
2015
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bernasek2015chemistrysurface Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Conor R. Thomas,Matthew K. Vallon,Matthew G. Frith,Hikmet Sezen,Satya K. Kushwaha,Robert J. Cava,Jeffrey Schwartz,Steven L. Bernasek;Conor R. Thomas;Matthew K. Vallon;Matthew G. Frith;Hikmet Sezen;Satya K. Kushwaha;Robert J. Cava;Jeffrey Schwartz;Steven L. Bernasek;
Journal chemistry of materials
Year 2015
DOI
10.1021/acs.chemmater.5b03923
URL
https://sciprofiles.com/publication/view/d7e16f8688ef67be76e873f841cb93fc
Keywords
topological insulators surface oxidation insulators depends cleavage oxidation of bi2

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