Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon

تأثير السطح البيني على الموصلية الحرارية المستعرضة لأغشية SiO2 المرسبة على السيليكون

Clicks: 239
ID: 117615
2011
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Abstract
Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon - Volume 516 - W. Zhao, F. R. Brotzen, L. Hehn, P. J. Loos
تأثير السطح البيني على الموصلية الحرارية المستعرضة لأغشية SiO2 المُرسبة على السيليكون - المجلد 516 - و. تشاو، إف. آر. بروتزن، إل. هين، بي. جيه. لوس
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zhao2011mrsinterface Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors
Journal mrs online proceedings library archive
Year 2011
DOI
doi:10.1557/PROC-516-51
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