Four methods for determining the composition of trace radioactive surface contamination of low-radioactivity metal

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ID: 117136
2011
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Authors H.M. O'keeffe,T.H. Burritt,B.T. Cleveland,G. Doucas,N. Gagnon,N.A. Jelley,C. Kraus,I.T. Lawson,S. Majerus,S.R. McGee,A.W. Myers,A.W.P. Poon,Keith Rielage,R.G. Hamish Robertson,R.C. Rosten,L.C. Stonehill,B.A. VanDevender,T.D. Van Wechel;H.M. O'keeffe;T.H. Burritt;B.T. Cleveland;G. Doucas;N. Gagnon;N.A. Jelley;C. Kraus;I.T. Lawson;S. Majerus;S.R. McGee;A.W. Myers;A.W.P. Poon;Keith Rielage;R.G. Hamish Robertson;R.C. Rosten;L.C. Stonehill;B.A. VanDevender;T.D. Van Wechel;
Journal nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment
Year 2011
DOI
10.1016/j.nima.2011.08.060
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