High Voltage Metrology with Collinear Laser Spectroscopy

Clicks: 239
ID: 116531
2018
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Authors Jorg Kramer,Kristian Konig,Christopher Geppert,Phillip Imgram,Bernhard Maab,Johann Meisner,Ernst Wilhelm Otten,Stephan Passon,Tim Ratajczyk,Johannes Ullmann,W. Nörtershäuser;Jorg Kramer;Kristian Konig;Christopher Geppert;Phillip Imgram;Bernhard Maab;Johann Meisner;Ernst Wilhelm Otten;Stephan Passon;Tim Ratajczyk;Johannes Ullmann;W. Nörtershäuser;
Journal 2018 conference on precision electromagnetic measurements (cpem 2018)
Year 2018
DOI
10.1109/cpem.2018.8501251
URL
https://sciprofiles.com/publication/view/9f24323c7f83bb1f8266f6f86f8256e3
Keywords
uncertainty ions voltage measurement laser excitation high-voltage techniques frequency measurement measurement by laser beam

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