In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter

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ID: 116210
2020
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Abstract
In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a density of current as low as 1–2 e−Å−2s−1. This provides a powerful method for true single-particle atomic resolution imaging and opens up new perspectives for the study of soft matter in biology and materials science. The approach is not limited to a particular class of TEM specimens, such as homogenous samples or samples specially designed for a particular TEM experiment, but has better application in the study of those specimens with differences in shape, chemical composition, crystallography, and orientation, which cannot be currently addressed at atomic resolution.
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carlino2020materialsin-line Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Elvio Carlino;Carlino, Elvio;
Journal Materials (Basel, Switzerland)
Year 2020
DOI
10.3390/ma13061413
URL
https://www.mdpi.com/1996-1944/13/6/1413#citedby
Keywords
tem in-line holography single particle imaging atomic resolution imaging radiation damage soft matter nanostructured drugs organic materials

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