In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter

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ID: 116210
2020
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Abstract
In this paper, for the first time it is shown how in-line holography in Transmission Electron Microscopy (TEM) enables the study of radiation-sensitive nanoparticles of organic and inorganic materials providing high-contrast holograms of single nanoparticles, while illuminating specimens with a density of current as low as 1–2 e−Å−2s−1. This provides a powerful method for true single-particle atomic resolution imaging and opens up new perspectives for the study of soft matter in biology and materials science. The approach is not limited to a particular class of TEM specimens, such as homogenous samples or samples specially designed for a particular TEM experiment, but has better application in the study of those specimens with differences in shape, chemical composition, crystallography, and orientation, which cannot be currently addressed at atomic resolution.
Reference Key
carlino2020materialsin-line Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Elvio Carlino;Carlino, Elvio;
Journal Materials (Basel, Switzerland)
Year 2020
DOI
10.3390/ma13061413
URL
https://www.mdpi.com/1996-1944/13/6/1413#citedby
Keywords
tem in-line holography single particle imaging atomic resolution imaging radiation damage soft matter nanostructured drugs organic materials

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