Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon

Clicks: 240
ID: 115774
1998
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loos1998mrsinterface Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors W. Zhao,F. R. Brotzen,L. Hehn,P. J. Loos;W. Zhao;F. R. Brotzen;L. Hehn;P. J. Loos;
Journal mrs proceedings
Year 1998
DOI
10.1557/proc-516-51
URL
https://sciprofiles.com/publication/view/5b981ea914cf3970ef6fefd77f9671bd
Keywords
model intercalation thermal polycrystalline sio2 monocrystalline transverse earlier substantially

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