Microstructure and thermoelectric properties of In2O3/ITO thin film thermocouples with Al2O3 protecting layer
Clicks: 250
ID: 115377
2018
Article Quality & Performance Metrics
Overall Quality
Improving Quality
0.0
/100
Combines engagement data with AI-assessed academic quality
Reader Engagement
Steady Performance
30.0
/100
249 views
14 readers
Trending
AI Quality Assessment
Not analyzed
Abstract
Abstract is not available for this article.
Login to Search Abstract
| Reference Key |
jiang2018journalmicrostructure
Use this key to autocite in the manuscript while using
SciMatic Manuscript Manager or Thesis Manager
|
|---|---|
| Authors | Yantao Liu,Wei Ren,Peng Shi,Dan Liu,Yijun Zhang,Ming Liu,Qijing Lin,Bian Tian,Zhuangde Jiang;Yantao Liu;Wei Ren;Peng Shi;Dan Liu;Yijun Zhang;Ming Liu;Qijing Lin;Bian Tian;Zhuangde Jiang; |
| Journal | journal of materials science: materials in electronics |
| Year | 2018 |
| DOI |
10.1007/s10854-018-0450-x
|
| URL | |
| Keywords |
Citations
No citations found. To add a citation, contact the admin at info@scimatic.org
Comments
No comments yet. Be the first to comment on this article.