Metrological Challenges in Collaborative Sensing: Applicability of Digital Calibration Certificates

Clicks: 306
ID: 113952
2020
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Emerging

Ranked #529 of 1,694 articles by views in sensors

Most read Least read

Bar heights use a square-root scale. Only the 120 most-read articles are drawn; the journal has 1,694 in total.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Abstract
IoT systems based on collaborative sensor networks are becoming increasingly common in various industries owing to the increased availability of low-cost sensors. The quality of the data provided by these sensors may be unknown. For these reasons, advanced data processing and sensor network self-calibration methods have become popular research topics. In terms of metrology, the self-calibration methods lack the traceability to the established measurement standards of National Metrology Institutes (NMIs) through an unbroken chain-link of calibration. This problem can be solved by the ongoing digitalization of the metrology infrastructure. We propose a conceptual solution based on Digital Calibration Certificates (DCCs), Digital SI (D-SI), and cryptographic digital identifiers, for validation of data quality and trustworthiness. The data that enable validation and traceability can be used to improve analytics, decision-making, and security in industrial applications. We discuss the applicability and benefits of our solutions in a selection of industrial use cases, where collaborative sensing has already been introduced. We present the remaining challenges in the digitization and standardization processes regarding digital metrology and the future work required to address them.
Reference Key
mustapää2020sensorsmetrological Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Tuukka Mustapää;Pekka Nikander;Daniel Hutzschenreuter;Raine Viitala;Mustapää, Tuukka;Nikander, Pekka;Hutzschenreuter, Daniel;Viitala, Raine;
Journal sensors
Year 2020
DOI
10.3390/s20174730
URL
Keywords

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.