Performance of a TiN-coated monolithic silicon pin-diode array under mechanical stress

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2012
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Authors B.A. VanDevender,Laura Bodine,A.W. Myers,J.F. Amsbaugh,M.A. Howe,M.L. Leber,R.G.H. Robertson,K. Tolich,T.D. Van Wechel,B.L. Wall;B.A. VanDevender;Laura Bodine;A.W. Myers;J.F. Amsbaugh;M.A. Howe;M.L. Leber;R.G.H. Robertson;K. Tolich;T.D. Van Wechel;B.L. Wall;
Journal nuclear instruments and methods in physics research section a: accelerators, spectrometers, detectors and associated equipment
Year 2012
DOI
10.1016/j.nima.2012.01.033
URL
https://sciprofiles.com/publication/view/60f31d7dd2907c2b7f2b9e3be57d460e
Keywords
silicon mechanical stress pin diode leakage current titanium nitride pogo pin

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