Reliability Enhancement of a Power Semiconductor With Optimized Solder Layer Thickness
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ID: 111855
2020
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| Reference Key |
moayedi2020ieeereliability
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| Authors | Elakkiya R,G. Kavithaa,Vahid Samavatian,K. Alhaifi,Alireza Kokabi,Hossein Moayedi;Elakkiya R;G. Kavithaa;Vahid Samavatian;K. Alhaifi;Alireza Kokabi;Hossein Moayedi; |
| Journal | ieee transactions on power electronics |
| Year | 2020 |
| DOI |
10.1109/tpel.2019.2951815
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