GaN Single Crystalline Substrates by Ammonothermal and HVPE Methods for Electronic Devices

Clicks: 295
ID: 111822
2020
Article Quality & Performance Metrics
Overall Quality
Not rated
Combines reader engagement with the AI quality analysis. This article has not been analysed, so there is no overall score — reader engagement is measured and shown alongside.
AI Quality Assessment
Not analyzed
Readership in this journal
Popular

Ranked #16 of 113 articles by views in Electronics

Most read Least read

Bar heights use a square-root scale.

Mint this article as an NFT
Not yet minted

Create a permanent, verifiable on-chain record of this article on the Scimatic Network. The NFT is held in your Journament account, and you can withdraw it to your own wallet at any time.

5 SUSD one-off · no wallet required
Abstract
Recent results of GaN bulk growth performed in Poland are presented. Two technologies are described in detail: halide vapor phase epitaxy and basic ammonothermal. The processes and their results (crystals and substrates) are demonstrated. Some information about wafering procedures, thus, the way from as-grown crystal to an epi-ready wafer, are shown. Results of other groups in the world are briefly presented as the background for our work.
Reference Key
grabianska2020electronicsgan Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Karolina Grabianska;Piotr Jaroszynski;Aneta Sidor;Michal Bockowski;Malgorzata Iwinska;Grabianska, Karolina;Jaroszynski, Piotr;Sidor, Aneta;Bockowski, Michal;Iwinska, Malgorzata;
Journal Electronics
Year 2020
DOI
10.3390/electronics9091342
URL
Keywords

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.