Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives
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2020
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| Reference Key |
shi2020atomicelectrochimica
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|---|---|
| Authors | Shi, X. |
| Journal | electrochimica acta |
| Year | 2020 |
| DOI | 10.1016/j.electacta.2019.135472 |
| URL | |
| Keywords | Keywords not found |
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