Minimum margin loss for deep face recognition

Clicks: 162
ID: 61119
2020
Article Quality & Performance Metrics
Overall Quality Improving Quality
0.0 /100
Combines engagement data with AI-assessed academic quality
AI Quality Assessment
Not analyzed
Reference Key
wei2020minimumpattern Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Wei, X.
Journal pattern recognition
Year 2020
DOI 10.1016/j.patcog.2019.107012
URL
Keywords Keywords not found

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.