Study of dosimetric properties of flattened and unflattened megavoltage x ray beam on high Z implant materials.

Abstract

Addition of high Z implants in the treatment vicinity or beam path is unavoidable in certain clinical situation. In this work, we study the properties of radiation interaction parameters such as mass attenuation coefficient (MAC), x ray beam transmission factor (indirect beam attenuation), interface effects like backscatter dose perturbation factor (BSDF) and forward dose perturbation factor (FDPF) for flattened (FF) and unflattened (UF) x ray beams.MAC for stainless steel and titanium alloy was measured using CC13 chamber with appropriate buildup in narrow beam geometry. The x ray beam transmission factors were measured for stainless steel and titanium alloy for different field size, off-axis, and depths. Profile analysis was performed using a radiation field analyzer (RFA) as a function of field size and depth to study the influence of phantom scattering and spectral variation in the beam. In addition, interface effects such as BSDF and FDPF were measured with gafchromic films at maximum BSDF peak position calculated using Acuros XB algorithm and with PPC40 chamber measured at exit side of high Z material, respectively.The MAC in both cases decreases with increase in energy for stainless steel (SS) and titanium (Ti) alloy. The MAC increases with the change in x ray beam type from flattened to UF beam because of relatively lower mean energy. The x ray beam transmission factor increases with the increase in energy, field size, and depth owing to increase in penetration power phantom scatter, respectively. The measured BSDF and FDPF were found to be in good agreement with AXB algorithm.The dosimetric properties of x ray photon beam were studied comprehensively in the presence of high Z material like stainless steel and titanium alloy using both flattened and UF beams to understand and incorporate the findings of various parameters in clinical condition due to the variation in energy spectrum from FF to UF x ray beam.