In search of a hole inversion layer in Pd/MoOx /Si diodes through I- v characterization using dedicated ring-shaped test structures
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| Reference Key |
gupta2019inieee
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|---|---|
| Authors | Gupta, G. |
| Journal | ieee international conference on microelectronic test structures |
| Year | 2019 |
| DOI | 10.1109/ICMTS.2019.8730920 |
| URL | |
| Keywords | Keywords not found |
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