Detrimental Fluctuation of Frequency Spacing between the Two High-Quality Resonant Modes in a Raman Silicon Nanocavity Laser
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ID: 29063
2020
| Reference Key |
kurihara2020detrimentalieee
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| Authors | Kurihara, J. |
| Journal | IEEE Journal of Selected Topics in Quantum Electronics |
| Year | 2020 |
| DOI | 10.1109/JSTQE.2019.2925718 |
| URL | |
| Keywords | Keywords not found |
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