High-Volume Testing and DC Offset Trimming Technique of On-Die Bandgap Voltage Reference for SOCs and Microprocessors
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ID: 22440
2019
| Reference Key |
oshita2019highvolumeieee
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| Authors | Oshita, T. |
| Journal | ieee transactions on very large scale integration (vlsi) systems |
| Year | 2019 |
| DOI | 10.1109/TVLSI.2018.2882567 |
| URL | |
| Keywords | Keywords not found |
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