Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon
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ID: 117615
2011
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Abstract
Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon - Volume 516 - W. Zhao, F. R. Brotzen, L. Hehn, P. J. Loos| Reference Key |
zhao2011mrsinterface
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| Authors | W. Zhao;F. R. Brotzen;L. Hehn;P. J. Loos; |
| Journal | mrs online proceedings library archive |
| Year | 2011 |
| DOI | doi:10.1557/PROC-516-51 |
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