Data acquisition and processing for automated electron microscopy
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1993
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wilbrink1993proceedings,data
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Authors | O.L. Krivanek,W.J. De Ruijter,C.E. Meyer,M.L. Leber,J. Wilbrink;O.L. Krivanek;W.J. De Ruijter;C.E. Meyer;M.L. Leber;J. Wilbrink; |
Journal | proceedings, annual meeting, electron microscopy society of america |
Year | 1993 |
DOI | 10.1017/s0424820100148563 |
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