Data acquisition and processing for automated electron microscopy

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ID: 115516
1993
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Authors O.L. Krivanek,W.J. De Ruijter,C.E. Meyer,M.L. Leber,J. Wilbrink;O.L. Krivanek;W.J. De Ruijter;C.E. Meyer;M.L. Leber;J. Wilbrink;
Journal proceedings, annual meeting, electron microscopy society of america
Year 1993
DOI 10.1017/s0424820100148563
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