Microstructure and thermoelectric properties of In2O3/ITO thin film thermocouples with Al2O3 protecting layer

Clicks: 233
ID: 115377
2018
Article Quality & Performance Metrics
Overall Quality Improving Quality
0.0 /100
Combines engagement data with AI-assessed academic quality
AI Quality Assessment
Not analyzed
Reference Key
jiang2018journalmicrostructure Use this key to autocite in the manuscript while using SciMatic Manuscript Manager or Thesis Manager
Authors Yantao Liu,Wei Ren,Peng Shi,Dan Liu,Yijun Zhang,Ming Liu,Qijing Lin,Bian Tian,Zhuangde Jiang;Yantao Liu;Wei Ren;Peng Shi;Dan Liu;Yijun Zhang;Ming Liu;Qijing Lin;Bian Tian;Zhuangde Jiang;
Journal journal of materials science: materials in electronics
Year 2018
DOI 10.1007/s10854-018-0450-x
URL
Keywords

Citations

No citations found. To add a citation, contact the admin at info@scimatic.org

No comments yet. Be the first to comment on this article.